Wavelengths
or
spectrum lines |
1153nm,
C',
633nm,
D,e,F',g,i,
254nm |
t,795nm,
780nm,
C,C',
633nm,
d,e,
F,F',g |
Spectral lines
measurable
between
185nm~2325nm |
t,795nm,
780nm,
C,C',
633nm,
d,e,
F,F',g |
t,795nm,
780nm,
C,C',
633nm,
d,e,
F,F',g |
Measuring
method |
Ohara original
equipment
(Interferometri
cmethod) |
Refractometer
(V-Block
method) |
Spectrometer
(Minimum
deviation
method) |
Refractometer
(V- Block
method) |
Refractometer
(V- Block
method) |